@INPROCEEDINGS{7479107,
author={M. {Buevich} and X. {Zhang} and O. {Shih} and D. {Schnitzer} and T. {Escalada} and A. {Jacquiau-Chamski} and J. {Thacker} and A. {Rowe}},
booktitle={2016 ACM/IEEE 7th International Conference on Cyber-Physical Systems (ICCPS)},
title={Microgrid Losses: When the Whole Is Greater Than the Sum of Its Parts},
year={2016},
volume={},
number={},
pages={1-10},
keywords={distributed power generation;power generation reliability;power grids;microgrid loss;nontechnical loss detection;NTL detection;electrical service reliability;total generation capacity;model-driven class;data-driven class;state uncertainty;line loss;meter consumption;meter calibration error;packet loss;sample synchronization error;regression technique;grid operation NTL-free period;SVM training data;synthetic NTL data;Les Anglais;Haiti;Microgrids;Topology;Logic gates;Data models;Home appliances;Reliability;Packet loss},
doi={10.1109/ICCPS.2016.7479107},
ISSN={},
pdf={http://users.ece.cmu.edu/\%7Eagr/resources/publications/iccps-2016.pdf},
month={April},}